Efficient Carrier Confinement in Deep-Ultraviolet Light-Emitting Diodes With Composition-Graded Configuration

作者: Jih-Yuan Chang , Hui-Tzu Chang , Ya-Hsuan Shih , Fang-Ming Chen , Man-Fang Huang

DOI: 10.1109/TED.2017.2761404

关键词: Ultraviolet light emitting diodesQuantumOptoelectronicsLeakage (electronics)Electric potentialDiodePotential barrier heightLight-emitting diodeMaterials scienceCurrent density

摘要: Characteristics of deep-ultraviolet (DUV) light-emitting diodes (LEDs) are investigated. DUV LEDs possess severe electron current leakage due to insufficient carrier confinement the active region. Simply increasing Al composition quantum barriers (QBs) or electron-blocking layer (EBL) enlarge relevant potential barrier height would arise unexpected detrimental effects, such as extra polarization effect more obstruction for hole injection. In this paper, band-engineered composition-graded QBs and EBL proposed resolve issue. Simulation results show that, with appropriate designs, could be effectively diminished just slight side effects.

参考文章(28)
DR Hang, CH Chen, YF Chen, HX Jiang, JY Lin, None, AlxGa1−xN/GaN band offsets determined by deep-level emission Journal of Applied Physics. ,vol. 90, pp. 1887- 1890 ,(2001) , 10.1063/1.1383259
James R. Grandusky, Shawn R. Gibb, Mark C. Mendrick, Craig Moe, Michael Wraback, Leo J. Schowalter, High Output Power from 260 nm Pseudomorphic Ultraviolet Light-Emitting Diodes with Improved Thermal Performance Applied Physics Express. ,vol. 4, pp. 082101- ,(2011) , 10.1143/APEX.4.082101
Han-Youl Ryu, Hyun-Sung Kim, Jong-In Shim, Rate equation analysis of efficiency droop in InGaN light-emitting diodes Applied Physics Letters. ,vol. 95, pp. 081114- ,(2009) , 10.1063/1.3216578
W. Götz, N. M. Johnson, J. Walker, D. P. Bour, R. A. Street, Activation of acceptors in Mg-doped GaN grown by metalorganic chemical vapor deposition Applied Physics Letters. ,vol. 68, pp. 667- 669 ,(1996) , 10.1063/1.116503
S L Chuang, C S Chang, A band-structure model of strained quantum-well wurtzite semiconductors Semiconductor Science and Technology. ,vol. 12, pp. 252- 263 ,(1997) , 10.1088/0268-1242/12/3/004
CH Wang, CC Ke, CY Lee, SP Chang, WT Chang, JC Li, ZY Li, HC Yang, Hao-Chung Kuo, TC Lu, SC Wang, None, Hole injection and efficiency droop improvement in InGaN/GaN light-emitting diodes by band-engineered electron blocking layer Applied Physics Letters. ,vol. 97, pp. 261103- ,(2010) , 10.1063/1.3531753
I. Vurgaftman, J. R. Meyer, Band parameters for nitrogen-containing semiconductors Journal of Applied Physics. ,vol. 94, pp. 3675- 3696 ,(2003) , 10.1063/1.1600519
H. Zhang, E. J. Miller, E. T. Yu, C. Poblenz, J. S. Speck, Measurement of polarization charge and conduction-band offset at InxGa1−xN/GaN heterojunction interfaces Applied Physics Letters. ,vol. 84, pp. 4644- 4646 ,(2004) , 10.1063/1.1759388
J. Simon, V. Protasenko, C. Lian, H. Xing, D. Jena, Polarization-Induced Hole Doping in Wide–Band-Gap Uniaxial Semiconductor Heterostructures Science. ,vol. 327, pp. 60- 64 ,(2010) , 10.1126/SCIENCE.1183226