Iteration methods for calculating self-consistent fields in semiconductor inversion layers
作者： Frank Stern
DOI: 10.1016/0021-9991(70)90004-5
关键词: Self consistent 、 Inversion (meteorology) 、 Mathematics 、 Semiconductor 、 Mathematical analysis
摘要: Abstract Two new methods for attaining convergence in self-consistent field calculations are described. They have been applied to semiconductor inversion layers at finite temperature.
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