Synchrotron-based photoluminescence excitation spectroscopy applied to investigate the valence band splittings in AlN and Al0.94Ga0.06N
作者： Martin Feneberg , Marcus Röppischer , Norbert Esser , Christoph Cobet , Benjamin Neuschl
DOI: 10.1063/1.3610469
关键词: Molecular physics 、 Semimetal 、 Photoluminescence 、 Ellipsometry 、 Band gap 、 Spectroscopy 、 Photoluminescence excitation 、 Analytical chemistry 、 Synchrotron 、 Absorption (electromagnetic radiation) 、 Materials science 、 Physics and Astronomy (miscellaneous)
摘要: We demonstrate that synchrotron-based photoluminescence excitation (PLE) spectroscopy is a versatile tool for determining valence band splittings of AlN and high aluminum content AlGaN. PLE results are independently confirmed by spectroscopic ellipsometry. The between the ordinary extraordinary absorption edges found to be −240 meV −170 Al0.94Ga0.06N, respectively. These values differ from crystal field energy due residual strain.
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