Traces of Defects in the Electronic Structure of Porous Ni–Ti Alloys
作者： O.M. Ozkendir , E. Cengiz , E. Tırasoglu , Mehmet Kaya , I.H. Karahan
DOI: 10.1016/J.JMST.2013.02.012
关键词: Extended X-ray absorption fine structure 、 Alloy 、 X-ray absorption fine structure 、 Electronic structure 、 Crystallography 、 Materials science 、 Spectroscopy 、 Crystal 、 Analytical chemistry 、 Absorption (electromagnetic radiation) 、 XANES
摘要: The electronic structures of Ni–Ti shape-memory alloy samples were investigated by X-ray absorption fine structure (XAFS) spectroscopy both experimentally and theoretically. In the experimental section, measured at low temperature to determine persistent traces preheating process atomic concentration effects on crystal near-edge (XANES) spectroscopy. As a second step, extended-X-ray (EXAFS) calculations, which are based different choices one electron potentials according Ti coordinations using real space multiple scattering method FEFF 8.2 code, performed. crystallographic porous alloys tested various temperatures ranging from 5 1323 K.
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