作者: Wentao Yu , Xusan Yang , Peng Xi , Kebin Shi , Kebin Shi
关键词: Microscopy 、 Imaging phantom 、 Stimulated emission 、 Optics 、 Diffraction 、 Gaussian beam 、 STED microscopy 、 Bessel beam 、 Image resolution 、 Materials science
摘要: Stimulated emission depletion (STED) microscopy has become a powerful imaging and localized excitation method, breaking the diffraction barrier for improved spatial resolution in cellular imaging, lithography, etc. Because of specimen-induced aberrations scattering distortion, it is great challenge STED to maintain consistent lateral deep inside specimens. Here we report on using Gaussian beam hollow Bessel (GB-STED). The proposed scheme shows an depth up about 155 μm solid agarose sample, 115 μm polydimethylsiloxane, 100 μm phantom gray matter brain tissue with super resolution, while standard significantly reduced at same depth. results indicate excellent penetration capability GB-STED, paving way super-resolution three-dimensional precise laser fabrication.