Development of terahertz wave microscopes
作者： T Yuan , JZ Xu , X-C Zhang , None
DOI: 10.1016/J.INFRARED.2004.01.016
关键词: Microscopy 、 Microscope 、 Materials science 、 Optics 、 Radiation 、 Image resolution 、 Diffraction 、 Near-field optics 、 Terahertz radiation 、 Near-field scanning optical microscope
摘要: Terahertz (THz) radiation has tremendous potential for inspection applications. However, due to the diffraction restriction, its spatial resolution is limited by long wavelength. Near-field technology improves of THz imaging. Recent developments near-field wave microscopzes are highlighted.
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