Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy
作者： H. Hölscher , W. Allers , U. D. Schwarz , A. Schwarz , R. Wiesendanger
DOI: 10.1103/PHYSREVLETT.83.4780
关键词: Magnetic force microscope 、 Dynamic force spectroscopy 、 Conductive atomic force microscopy 、 Non-contact atomic force microscopy 、 Materials science 、 Atomic physics 、 Sample (graphics) 、 Kelvin probe force microscope
摘要:
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sci-hub.se 参考文章(22)
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