How to probe structure, kinetics and dynamics at complex interfaces in situ and operando by optical spectroscopy

作者: A. Erbe , S. Nayak , Y.-H. Chen , F. Niu , M. Pander

DOI: 10.1016/B978-0-12-409547-2.14061-2

关键词: OptoelectronicsRaman spectroscopySum frequency generation spectroscopySpectroscopyUltravioletAnalytical chemistryAbsorption spectroscopyEllipsometryMaterials sciencePolarization (waves)Photoluminescence

摘要: Techniques using light in a large spectral range are well suited to study interfaces. Photon-based techniques have special strength when it comes application situ and operando. This article introduces some of the most commonly used experimental techniques. Absorption spectroscopy far-, mid-, near-infrared (IR), visible (VIS) ultraviolet (UV) is simple method obtain interface equivalent type information normally obtained by respective bulk method. Also photoluminescence/fluorescence Polarization, for example, ellipsometry, or polarization-modulated can increase specificity. The same could be achieved surface enhancement, surface-enhanced Raman spectroscopy. IR/VIS sum frequency generation (SFG) has intrinsic Main working principles these introduced, with reference more detailed coverage elsewhere, examples application. Overall, suitable yield qualitative quantitative on which species present at interfaces, conformation state defects develop solids. Frequently, also orientation obtained.

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