作者: Artun Kutchuk , Ira Leventhal , Keith Schaub , Derek Diperna
DOI:
关键词: System level testing 、 Computer hardware 、 Stylus 、 Wireless 、 Robotic arm 、 Wireless access point 、 System controller 、 Mode (computer interface) 、 Engineering 、 Smart device 、 Embedded system
摘要: An automatic system level testing (ASLT) for smart devices is disclosed. The comprises a controller coupled to device in an enclosure, wherein the memory comprising test logic and processor. enclosure plurality of components, processor configured automatically control components accordance with logic. comprises: (a) robotic arm stylus affixed thereto; (b) platform holder thereto, inserted into holder; (c) wireless access point. further to: activate mode; receive signals from point using device; retrieve scan results (d) analyze results.