作者: Weilin Jiang , Limin Zhang , Chenglong Pan , Lei Wang , Liang Chen
DOI: 10.1016/J.NIMB.2021.02.005
关键词: Transmission electron microscopy 、 Nanocrystalline material 、 Nucleation 、 Composite material 、 Crystallographic defect 、 Grain boundary 、 Stacking 、 Irradiation 、 Materials science 、 Silicon carbide
摘要: … Compared to single-crystal SiC, nanocrystalline SiC with … in nanocrystalline 3C-SiC with dense stacking faults using … for its single-crystal SiC counterpart under the identical irradiation …