作者: Xiandeng Hou , Peter Stchur , Karl X Yang , Robert G Michel
DOI: 10.1016/S0165-9936(98)00057-0
关键词: Optoelectronics 、 Excited state 、 Analytical chemistry 、 High selectivity 、 Laser 、 Dye laser 、 Chemistry 、 Atomic fluorescence spectrometry
摘要: Abstract Laser excited atomic fluorescence spectrometry, LEAFS, is a high sensitivity, selectivity, spectrometric technique. This paper reviews progress in LEAFS over the last several years, with emphasis on new lasers, detectors, modifications to atomizers, and multi-element measurement approaches. Applications of real sample analyses are also highlighted.