Mechanistic Study of Defect-Induced Oxidation of Graphite

作者: J. R. Hahn , H. Kang , S. M. Lee , Y. H. Lee

DOI: 10.1021/JP9920895

关键词: Scanning tunneling microscopeChemical engineeringCrystallographyGraphiteMaterials science

摘要: Oxidation of a graphite initiated from surface defects is investigated by using scanning tunneling microscopy (STM) and density functional (DF) calculation. The are created on su...

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