INSPECTION SYSTEM, IMAGE PROCESSING APPARATUS, METHOD, AND PROGRAM

作者: Uchiyama Naoya

DOI:

关键词: Computer visionMetreDisplacement (vector)System imageImage processingComputer scienceArtificial intelligenceSet (abstract data type)Product inspection

摘要: PROBLEM TO BE SOLVED: To provide a method of allowing displacement meter, which can execute product inspection without connecting an image processing apparatus, to be set from the apparatus when connected thereto.SOLUTION: When stand-alone two-dimensional profile measuring unit 10 is 20, control parameter on as well external 30.