作者: J. L. Robins , R. J. Celotta , J. Unguris , D. T. Pierce , B. T. Jonker
DOI: 10.1063/1.99616
关键词: Optics 、 Polarization (waves) 、 Epitaxy 、 Magnetization 、 Condensed matter physics 、 Magnetic domain 、 Thin film 、 Scanning electron microscope 、 Electron 、 Monolayer 、 Materials science
摘要: Scanning electron microscopy with polarization analysis has been used to image domains of ultrathin Fe films grown epitaxially on a Ag(100) substrate. Room‐temperature measurements show clearly the existence large in‐plane magnetization for film thicknesses 3.4 monolayers or more. No were observed thinner films.