Near-infrared double negative metamaterials

作者: Shuang Zhang , Wenjun Fan , K. J. Malloy , S.R. J. Brueck , N. C. Panoiu

DOI: 10.1364/OPEX.13.004922

关键词: Refractive indexOpticsThin filmMaterials scienceRefractionNegative refractionSemiconductorParametric statisticsDispersion (optics)Metamaterial

摘要: We numerically demonstrate a metamaterial with both negative e and µ over an overlapping near-infrared wavelength range resulting in low loss negative-index material. Parametric studies optimizing this index are presented. This structure can be easily fabricated standard semiconductor processing techniques.

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