High Resolution Electron Microscopy of Surfaces and Interfaces
作者： H. W. Zandbergen
关键词: Optoelectronics 、 High resolution electron microscopy 、 Electron energy loss spectroscopy 、 Scanning confocal electron microscopy 、 Materials science 、 Energy filtered transmission electron microscopy
摘要:
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sci-hub.se 参考文章(34)
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