Interface-type resistive switching in perovskite materials

作者: S. Bagdzevicius , K. Maas , M. Boudard , M. Burriel

DOI: 10.1007/S10832-017-0087-9

关键词: FerroelectricityResistive random-access memoryEngineering physicsDopingOxidePerovskite (structure)NanotechnologyFigure of meritValence (chemistry)Materials scienceMicroelectronics

摘要: Resistive switching (RS) is currently one of the hot topics in frontier between materials science and microelectronics, crosslinking both research communities. Among different types RS phenomena that have been reported, this review focuses particularly on interface-type RS, for which change resistance related to a modification properties occurring at interface over entire electrode area. In particular we summarized most interesting reports perovskite oxides, versatile oxide crystal structure presents plethora functional depending its exact composition structural symmetry. We present relevant mechanisms inducing such as valence change, due combination oxygen vacancy drift redox reactions; electronic correlations; ferroelectricity. For each case explain physico-chemical processes triggered by application an external voltage (or current), ultimately lead metal oxide. Special attention paid material aspects switching, how characteristics can be improved or cation doping off-stoichiometry, introduction additional layers changing nature electrodes. Recent progress memristive devices based perovskites also reported figures merit reached are compared those obtained state-of-the-art filamentary type binary oxides.

参考文章(152)
XJ Liu, XM Li, Qun Wang, WD Yu, Rui Yang, Xun Cao, XD Gao, LD Chen, Improved resistive switching properties in Ti/TiOx/La0.7Ca0.3MnO3/Pt stacked structures Solid State Communications. ,vol. 150, pp. 137- 141 ,(2010) , 10.1016/J.SSC.2009.09.032
F.A. Kröger, H.J. Vink, Relations between the Concentrations of Imperfections in Crystalline Solids Journal of Physics C: Solid State Physics. ,vol. 3, pp. 307- 435 ,(1956) , 10.1016/S0081-1947(08)60135-6
Musarrat Hasan, Rui Dong, H. J. Choi, D. S. Lee, D.-J. Seong, M. B. Pyun, Hyunsang Hwang, Uniform resistive switching with a thin reactive metal interface layer in metal-La0.7Ca0.3MnO3-metal heterostructures Applied Physics Letters. ,vol. 92, pp. 202102- ,(2008) , 10.1063/1.2932148
I.G. Baek, M.S. Lee, S. Sco, M.J. Lee, D.H. Seo, D.-S. Suh, J.C. Park, S.O. Park, H.S. Kim, I.K. Yoo, U.-I. Chung, J.T. Moon, Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses international electron devices meeting. pp. 587- 590 ,(2004) , 10.1109/IEDM.2004.1419228
D. S. Kim, C. E. Lee, Y. H. Kim, Y. T. Kim, Effect of oxygen annealing on Pr0.7Ca0.3MnO3 thin film for colossal electroresistance at room temperature Journal of Applied Physics. ,vol. 100, pp. 093901- ,(2006) , 10.1063/1.2364386
M. Kawasaki, I. H. Inoue, H. Akoh, T. Kanno, Y. Tokura, H. Adachi, H. Sato, A. Odagawa, Colossal electroresistance of a Pr0.7Ca0.3MnO3 thin film at room temperature Physical Review B. ,vol. 70, ,(2004)
Hwan-Soo Lee, James A. Bain, Sukwon Choi, Paul A. Salvador, Electrode influence on the transport through SrRuO3∕Cr-doped SrZrO3/metal junctions Applied Physics Letters. ,vol. 90, pp. 202107- ,(2007) , 10.1063/1.2739081
R. Dong, W. F. Xiang, D. S. Lee, S. J. Oh, D. J. Seong, S. H. Heo, H. J. Choi, M. J. Kwon, M. Chang, M. Jo, M. Hasan, Hyunsang Hwang, Improvement of reproducible hysteresis and resistive switching in metal-La0.7Ca0.3MnO3-metal heterostructures by oxygen annealing Applied Physics Letters. ,vol. 90, pp. 182118- ,(2007) , 10.1063/1.2736268
L. Eric Cross, Jan Fousek, Alexander K. Tagantsev, Domains in Ferroic Crystals and Thin Films ,(2010)
Toshitsugu Sakamoto, Kevin Lister, Naoki Banno, Tsuyoshi Hasegawa, Kazuya Terabe, Masakazu Aono, Electronic transport in Ta2O5 resistive switch Applied Physics Letters. ,vol. 91, pp. 092110- ,(2007) , 10.1063/1.2777170