作者: Naoaki Yoshida , Michio Kiritani , F. Eiichi Fujita
DOI: 10.1143/JPSJ.39.170
关键词: Dislocation 、 High voltage electron microscopy 、 Nucleation 、 Crystallographic defect 、 Impurity 、 Irradiation 、 Electron microscope 、 Atomic physics 、 Materials science 、 Molecular physics 、 Atmospheric temperature range 、 General Physics and Astronomy
摘要: … damage using a high voltage electron microscope (HVEM) have been performed and it was revealed that the method was useful in the study not only of radiation damage itself … damage …