Electron Radiation Damage of Iron in High Voltage Electron Microscope

作者: Naoaki Yoshida , Michio Kiritani , F. Eiichi Fujita

DOI: 10.1143/JPSJ.39.170

关键词: DislocationHigh voltage electron microscopyNucleationCrystallographic defectImpurityIrradiationElectron microscopeAtomic physicsMaterials scienceMolecular physicsAtmospheric temperature rangeGeneral Physics and Astronomy

摘要: … damage using a high voltage electron microscope (HVEM) have been performed and it was revealed that the method was useful in the study not only of radiation damage itself … damage …

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