Fine-structure-resolved measurements of photoelectron angular distributions by single-photon detachment ofSn−at visible wavelengths

摘要: The spectral dependence of the angular distributions photoelectrons produced by single-photon detachment ${\mathrm{Sn}}^{\ensuremath{-}} [\mathrm{core}, {(5s}^{2}, {5p}^{3})]$ ions has been measured at four discrete photon wavelengths ranging from 457.9 to 514.5 nm (2.71\char21{}2.41 eV) using a crossed laser-ion beams apparatus. Values fine-structure-resolved asymmetry parameters have determined fits photoelectron yield as function angle between polarization vector and linear momentum collected photoelectrons. for ${\mathrm{Sn}}^{\ensuremath{-}}$ are compared previous parameter measurements negative with similar electronic configurations. were also fit previously reported model photodetaching p-orbital electrons ions.