Smart B-I-T (Built-In-Test)
作者： Charles H. Cooper , John Zbytniewski
DOI:
关键词: Fault (power engineering) 、 Electronic systems 、 Real-time computing 、 Information technology 、 Reliability engineering 、 Environmental stress 、 Fault indicator 、 Engineering
摘要: A smart built-in-test device for classifying fault behavior in electronic systems comprising a temporal monitor monitoring fault, and generating data as the system operates real time; one or more sensors measuring environmental stress conditions real-time outputting condition data. correlator receiving correlating to determine if significant correlation exists.
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