The role of substrate temperature and bias in the plasma deposition from tetramethylsilane

作者: P Favia , R Lamendola , R d'Agostino

DOI: 10.1088/0963-0252/1/1/007

关键词: Chemical compositionSubstrate (chemistry)Analytical chemistryOxygenIonDeposition (phase transition)TetramethylsilaneChemistryArgonIon plating

摘要: Thin transparent polymeric films have been deposited from low-pressure argon/tetramethylsilane radio-frequency glow discharges at controlled substrate bias and temperature. The effect of positive ion bombardment temperature on both film growth rate chemical composition has studied. An account the post-discharge fast oxidation exposed to oxygen is also given. A general deposition mechanism proposed.

参考文章(27)
Riccardo d'Agostino, Francesco Cramarossa, Santolo De Benedictis, Francesco Fracassi, Optical emission spectroscopy and actinometry in CCl4-Cl2 radiofrequency discharges Plasma Chemistry and Plasma Processing. ,vol. 4, pp. 163- 178 ,(1984) , 10.1007/BF00566839
F. Jansen, J. Mort, Plasma deposited thin films pdtf. ,(1986)
Yoshiko Suzuki, Scott Meikle, Yasuo Fukuda, Yoshinori Hatanaka, XPS Studies of a-Si1-xCx:H Prepared from C2H4/SiH4Gas Mixtures Japanese Journal of Applied Physics. ,vol. 29, pp. L663- L665 ,(1990) , 10.1143/JJAP.29.L663
R. D'Agostino, F. Cramarossa, F. Fracassi, E. Desimoni, L. Sabbatini, P.G. Zambonin, G. Caporiccio, Polymer film formation in C2F6H2 discharges Thin Solid Films. ,vol. 143, pp. 163- 175 ,(1986) , 10.1016/0040-6090(86)90384-6
L. Gammie, C. Sandorfy, O. P. Strausz, Photochemistry of silicon compounds. 6. The 147-nm photolysis of tetramethylsilane The Journal of Physical Chemistry. ,vol. 80, pp. 2531- 2538 ,(1976) , 10.1021/J100487A004
Richard S. Crandall, Deep electron traps in hydrogenated amorphous silicon Physical Review B. ,vol. 24, pp. 7457- 7459 ,(1981) , 10.1103/PHYSREVB.24.7457
C. Bourreau, Y. Catherine, P. Garcia, Glow discharge deposition of silicon dioxide and aluminum oxide films: A kinetic model of the surface processes Plasma Chemistry and Plasma Processing. ,vol. 10, pp. 247- 260 ,(1990) , 10.1007/BF01447129
J C Manifacier, J Gasiot, J P Fillard, A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film Journal of Physics E: Scientific Instruments. ,vol. 9, pp. 1002- 1004 ,(1976) , 10.1088/0022-3735/9/11/032
Natasha C.Us, R. W. Sadowski, J. W. Coburn, Quartz crystal microbalance simulation of the directionality of Si etching in CF4 glow discharges Plasma Chemistry and Plasma Processing. ,vol. 6, pp. 1- 10 ,(1986) , 10.1007/BF00573817