作者: Huajie Yin , Daniele Cangialosi , Andreas Schönhals
DOI: 10.1016/J.TCA.2013.05.034
关键词: Composite material 、 Layer (electronics) 、 Analytical chemistry 、 Capacitive sensing 、 Thermal 、 Annealing (glass) 、 Polystyrene 、 Spectroscopy 、 Adsorption 、 Glass transition 、 Materials science
摘要: a b s t r c Broadband dielectric spectroscopy (BDS), specific heat (HCS) and capacitive scanning dilatometry (CSD) are used to study the glass transition segmental dynamics in thin supported polystyrene (PS) films. Different molecular weights (Mw = 50 kg/mol, Mw 260 1408 kg/mol) annealing protocols employed study. The is independent of film thickness for each temperature window measurement. thermal tran- sition temperature, Tg, measured by CSD depends on shows also dependence Mw. These observations explained terms formation irreversibly adsorbed layer due chain adsorption Al substrates during annealing.