作者: D. M. Whittaker , I. S. Culshaw
关键词: Optics 、 Boundary value problem 、 Reflection (physics) 、 Waveguide 、 Scattering 、 Photonics 、 Wave propagation 、 Materials science 、 Optoelectronics 、 Electromagnetic radiation 、 Emission spectrum
摘要: We present calculations of surface reflectivity and emission spectra for multilayer dielectric waveguides with a two-dimensional patterning deep holes. The are obtained using scattering-matrix treatment to propagate electromagnetic waves through the structure. This incorporates, in natural way, extended boundary conditions necessary describe external reflection processes. calculated demonstrate how such measurements can be used obtain experimental information about waveguide photonic band structure, coupling scattering modes fields, field distribution within waveguide.