作者: R. F. Egerton
DOI: 10.1080/14786437508229296
关键词: Valence electron 、 Scattering 、 X-ray Raman scattering 、 Amorphous carbon 、 Atomic physics 、 Electron 、 Electron energy loss spectroscopy 、 Inelastic scattering 、 Range (particle radiation) 、 Physics
摘要: Abstract The cross-section for inelastic scattering of 80 keV electrons in thin films evaporated carbon has been measured as a function energy loss (from 10 to 600 eV) and angle (up 0·1 rad). onergy-loss spectrum shows broad peak around 24 eV, believed arise mainly from plasmon oscillation valence electrons. Losses between 50 280 eV are principally due single interband transitions the electrons, their intensity being proportional (energy loss)−r , with r range 4 4·5. Their angular distribution within 20—50 mrad (dependent on loss) which can be explained using oither wave-mechanical or ballistic model. K-shell excitation > 285 was angle; results appear good agreement Bethe theory. Implications transmission electron microscopy organic materials discussed refore...