作者: H.M. Kramer , J.A. Venables
DOI: 10.1016/0022-0248(72)90265-5
关键词: Molecular physics 、 Xenon 、 Epitaxy 、 Materials science 、 Stacking-fault energy 、 Crystallography 、 Rare gas 、 Limit (mathematics)
摘要: Abstract Rare gas crystals can be grown epitaxially on various substrates. Some results which were obtained by in situ TEM are presented. An attempt is made to derive from these an upper limit for the stacking fault energy of xenon.