作者: A.A. Masoudi , S. Hosseinabadi
DOI: 10.1016/J.CHAOS.2020.110596
关键词: Critical exponent 、 Noise (electronics) 、 Condensed matter physics 、 Normal distribution 、 Exponent 、 Scaling 、 Hurst exponent 、 Detrended fluctuation analysis 、 Fractal analysis 、 Physics
摘要: Abstract We study the random deposition model with long-range spatially correlated noise. In this particles deposit in a power-law distance of each other as Δ i , j = n t [ u − 1 2 ρ ] where is chosen randomly over range (0,1) and correlation strength. The results show that enhancement exponent accompanied by appearance irregularities jumps height fluctuations. spite scaling exponents dependent to strength linear non-linear growth equations, strength, does not change β / . As short-range correlations equations result roughness saturation, saturate interface width for any system size. fractal analysis fluctuations performed via multi-fractal detrended fluctuation (MF-DFA) revealed synthetic rough surfaces 0 are mono-fractal Hurst H 0.5 It verifies un-correlated simple model. For strengths [0,1], increases ) behavior. critical c multi-affinity occurred. > feature tends multi-affine one exponent. observed because deviation from normal distribution among small large