Distribution of damage along an MeV ion track
作者： T.A. Tombrello
DOI: 10.1016/0168-583X(93)95879-A
关键词: Ion 、 Excitation 、 Dielectric 、 Track (disk drive) 、 Range (particle radiation) 、 Materials science 、 Mica 、 Ion track 、 Energy (signal processing) 、 Atomic physics
摘要: It is well known that at low values or dE/dx the damage along path an ion in a dielectric solid not uniform. This distribution damaged regions versus type and energy provides most direct to understanding mechanism that initiates formation of track. In this report I extract distribution from recently published data on tracks in Y_3Fe_5O_(12) compare it with extant obtained for mica. found these crystalline materials, which greatest amount exist, provide virtually identical picture process. For such materials loss primarily to electronic excitation material typically keV/nm range.
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