Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope
作者： H T Lin , S L Wu , J W Wang , T J Chen , M J Wang
DOI: 10.1088/0953-2048/28/8/085006
关键词: London penetration depth 、 Nanotechnology 、 Scanning SQUID microscope 、 Analytical chemistry 、 Materials science 、 Thin film 、 Penetration (firestop) 、 Superconductivity
摘要: We use the scanning SQUID microscope (SSM) to image vortices in superconducting FeSe0.3Te0.7 (FST) thin films. The observed peak flux value of FST is nearly a quarter that an accompanying Nb film. developed method for quantitatively determining London penetration depth film from known Nb. obtained value, 0.88 μm, significantly larger than those single crystals similar compositions by using other methods. methodology this study useful measuring depths thin-film superconductors general.
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