作者: Mojammel H. Mondal , M. Mukherjee
DOI: 10.1016/J.POLYMER.2010.09.045
关键词: Annealing (metallurgy) 、 Polymer 、 Order of magnitude 、 X-ray reflectivity 、 Exponential decay 、 Electron density 、 Time constant 、 Chemical physics 、 Chemistry 、 Thin film 、 Analytical chemistry
摘要: The structural aspects of polyacrylamide thin films annealed at degradation threshold temperature have been studied as a function annealing time using in situ X-ray reflectivity technique vacuum. We observe significant decrease thickness and increase density with for all the films. dynamical behavior changes was modeled terms two distinct exponential decay functions, following our earlier observation different scales chemical modification pathways, found to be excellent agreement data. diffusion coefficients polymer chains corresponding modes are by an order magnitude. It that correspond formation products rates. larger constants both case reduction compare explained inter-chain entanglement attachment substrate.