Stochastic model for surface erosion via ion sputtering: Dynamical evolution from ripple morphology to rough morphology.

作者: Rodolfo Cuerno , Hernán A. Makse , Silvina Tomassone , Stephen T. Harrington , H. Eugene Stanley

DOI: 10.1103/PHYSREVLETT.75.4464

关键词: Statistical physicsContinuum (measurement)PhysicsRippleStochastic modellingIon sputteringScaling

摘要: Surfaces eroded by ion sputtering are sometimes observed to develop morphologies which either ripple (periodic) or rough (nonperiodic). We introduce a discrete stochastic model that allows us interpret these experimental observations within unified framework. find periodic morphology characterizes the initial stages of evolution, whereas surface displays self-affine scaling in later time regime. Further, we argue continuum equation describing height is noisy version Kuramoto-Sivashinsky equation.

参考文章(30)
Albert-Laszló Barabási, Harry Eugene Stanley, Fractal Concepts in Surface Growth ,(1995)
Paul Meakin, The growth of rough surfaces and interfaces Physics Reports. ,vol. 235, pp. 189- 289 ,(1993) , 10.1016/0370-1573(93)90047-H
E. Chason, T. M. Mayer, B. K. Kellerman, D. T. McIlroy, A. J. Howard, Roughening instability and evolution of the Ge(001) surface during ion sputtering. Physical Review Letters. ,vol. 72, pp. 3040- 3043 ,(1994) , 10.1103/PHYSREVLETT.72.3040
T. M. Mayer, E. Chason, A. J. Howard, Roughening instability and ion‐induced viscous relaxation of SiO2 surfaces Journal of Applied Physics. ,vol. 76, pp. 1633- 1643 ,(1994) , 10.1063/1.357748
Rodolfo Cuerno, Albert-László Barabási, Dynamic scaling of ion-sputtered surfaces. Physical Review Letters. ,vol. 74, pp. 4746- 4749 ,(1995) , 10.1103/PHYSREVLETT.74.4746
Elliott A. Eklund, R. Bruinsma, J. Rudnick, R. Stanley Williams, Submicron-scale surface roughening induced by ion bombardment. Physical Review Letters. ,vol. 67, pp. 1759- 1762 ,(1991) , 10.1103/PHYSREVLETT.67.1759
Elliott A. Eklund, Eric J. Snyder, R.Stanley Williams, Correlation from randomness: quantitative analysis of ion-etched graphite surfaces using the scanning tunneling microscope Surface Science. ,vol. 285, pp. 157- 180 ,(1993) , 10.1016/0039-6028(93)90427-L
J. Krim, I. Heyvaert, C. Van Haesendonck, Y. Bruynseraede, Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces Physical Review Letters. ,vol. 70, pp. 57- 60 ,(1993) , 10.1103/PHYSREVLETT.70.57