Fundamental Bulk/Surface Structure–Photoactivity Relationships of Supported (Rh2–yCryO3)/GaN Photocatalysts

作者: Somphonh P. Phivilay , Charles A. Roberts , Alexander A. Puretzky , Kazunari Domen , Israel E. Wachs

DOI: 10.1021/JZ401884C

关键词: Materials scienceRaman spectroscopyThin filmPhotochemistryLow-energy ion scatteringX-ray photoelectron spectroscopyNitrideChemical engineeringSpectroscopySurface layerWater splitting

摘要: The supported (Rh2–y Cr y O3)/GaN photocatalyst was examined as a model nitride photocatalyst system to assist in the development of fundamental structure–photoactivity relationships for UV activated water splitting. Surface characterization of the outermost surface layers by high-sensitivity low energy ion scattering (HS-LEIS) and high-resolution X-ray photoelectron spectroscopy (HR-XPS) revealed that the GaN support consists of a GaO x outermost surface layer on a thin film of GaO x N y. HR-XPS demonstrates that the supported …

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