Contactless hall coefficient measurement apparatus and method for piezoelectric material

作者: Herbert A. Leupold , Arthur Ballato

DOI:

关键词: Magnetic fieldAnalytical chemistryHall effectPiezoelectricitySemiconductorElectrical resistivity and conductivityOpticsChemistryElectrodeSample (graphics)Resonance

摘要: A method and apparatus for the contactless, non-destructive measurement of Hall coefficient resistivity a piezoelectric semiconductor sample. The material to be tested is formed in disk which supported at its edge by holder. disc free vibrate. Two pairs electrodes, placed above below sample, excite sample into beyond resonance. Then magnetic field applied again driven Comparison between performance before after application yields data from can determined.

参考文章(9)
Frederick Y. T. Cho, Michael D. Adamo, Frederick S. Hickernell, Piezoelectric material testing method and apparatus ,(1984)
A. Ballato, E.R. Hatch, M. Mizan, T.J. Lukaszek, Lateral Field Equivalent Networks and Piezocoupling Factors of Quartz Plates Driven in Simple Thickness Modes IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control. ,vol. 33, pp. 385- 393 ,(1986) , 10.1109/T-UFFC.1986.26846
Gerald J. Iafrate, Arthur Ballato, Contactless resistivity measurement method and apparatus ,(1980)
Lawrence N. Dworsky, Garth R. Kennedy, Method for determining surface contour of piezoelectric wafers ,(1982)
Elmer L. Allen, Hirohisa Kawamoto, Resistivity measurement system ,(1978)
Rudolf H Bechmann, Piezoelectric crystal apparatus ,(1959)
Ballato Arthur D, Rudolf Bechmann, Piezoelectric crystal element ,(1963)