Comparison of theoretical and experimental electronic distributions of Si - Ni and Si - Er alloys

摘要: The total and partial densities of states , have been calculated using a scalar relativistic self-consistent augmented plane-wave method () or linear muffin-tin orbital in the atomic sphere approximation ( ). x-ray photoemission valence band soft-x-ray emission Si K Ni L spectra by applying appropriate broadening factors to theoretical densities-of-states curves; case spectra, photoionization cross sections taken into account. Very good agreement is found between experimental simulated spectral curves.