作者: Kohei Yokoi , Yujiro Ohba
DOI: 10.1080/00268948608080206
关键词: Molecular physics 、 Crystallography 、 Anthracene 、 Dislocation 、 Chemistry 、 Plastic bending 、 Single crystal 、 Crystallographic defect 、 Trapping 、 Crystal 、 Activation energy
摘要: Abstract Structural imperfections were generated in anthracene single crystals at 93 K by plastic bending and thermal stress. The number of stages the triplet exciton traps anneal characteristics defects measured 93-423 then analyzed quantitatively. depth trap (0.37, 0.26 eV) activation energies for defect-recovery (1.34, 1.09 obtained ((001) [O1O] (001) [1OO]) edge dislocations, introduced along n b crystal axis, respectively. Each dislocation is accompanied one or two shallower traps. Thermal consisted all observed mechanically-deformed samples plus other annealed below room temperature.