作者: R. E. Imhof , C. J. Whitters , D. J. S. Birch
DOI: 10.1007/978-3-540-46972-8_11
关键词: Thermal wave 、 Thermal 、 Time domain 、 Materials science 、 Infrared 、 Decay curve 、 Thermal emission 、 Radiometry 、 Optics
摘要: The use of wavelength-selective infrared detection in opto-thermal radiometry can bring new insights the study phenomena and possibilities for non-destructive examination condensed media. We present principles, with recent illustrative results.