作者: Menno Willem José Prins , Ronald Jansen , Maurice Christienus Martinus Maria Van Der Wielen , Herman Van Kempen , Daniël Lee Abraham
DOI:
关键词: Optics 、 Polarization (waves) 、 Detector 、 Radiation 、 Electromagnetic radiation 、 Microscope 、 Tunnel current 、 Optoelectronics 、 Surface photovoltage 、 Near and far field 、 Materials science
摘要: A measuring device for the intensity and/or polarization of electromagnetic radiation, more in particular light. The is provided with a tunnel tip arranged facing body at some distance, which least partly consists semiconductor material. further comprises control unit obtaining information about radiation by means current, generated under influence tip, between and surface photovoltage radiation. can be used as near field microscope, selective detector. In one special embodiment forms an storage medium.