Wireless no-touch testing of integrated circuits

作者： Andrew S. Hildebrant

DOI:

关键词: Test method 、 Test data 、 Integrated circuit 、 Wireless network interface controller 、 Embedded system 、 Mixed-signal integrated circuit 、 Concurrent testing 、 Computer science 、 Wireless network 、 Automatic test equipment

摘要: A wireless integrated circuit test method and system is presented. The invention allows testing of one or more circuits configured with a interface access mechanism which controls input data received over connection from station to structures functional blocks on the circuit. Via connection, multiple similarly equipped devices under can be tested simultaneously. also enables concurrent independently testable any given test.