Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review.

作者: Liam Collins , Jason I Kilpatrick , Sergei V Kalinin , Brian J Rodriguez

DOI: 10.1088/1361-6633/AAB560

关键词: NanotechnologyPhysicsKelvin probe force microscopeField (physics)Grain boundaryDielectricSurface chargeElectrical phenomenaScanning probe microscopyElectrical measurements

摘要: … (EFM & KPFM) at the gas–solid interface, review the state of the art in advanced KPFM methods and … of classical KPFM,(ii) expand the information accessible from KPFM, and (iii) extend …

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