作者: Liam Collins , Jason I Kilpatrick , Sergei V Kalinin , Brian J Rodriguez
关键词: Nanotechnology 、 Physics 、 Kelvin probe force microscope 、 Field (physics) 、 Grain boundary 、 Dielectric 、 Surface charge 、 Electrical phenomena 、 Scanning probe microscopy 、 Electrical measurements
摘要: … (EFM & KPFM) at the gas–solid interface, review the state of the art in advanced KPFM methods and … of classical KPFM,(ii) expand the information accessible from KPFM, and (iii) extend …