Near-Field High-Frequency Probing
作者： C. A. Paulson , D. W. Van Der Weide
DOI: 10.1007/978-0-387-28668-6_11
关键词: Near and far field 、 Optics 、 Microwave 、 Coaxial probe 、 Infrared 、 Electrostatic force microscope 、 Dielectric 、 Materials science 、 Microscopy 、 Image contrast
摘要: We review a range of near-field probes that have been used for measuring the localized high-frequency electromagnetic properties materials. First, microscopy is briefly discussed, thereby establishing background describing probing experiments. The basic dielectric metals, insulators, and dielectrics are reviewed since these provide basis image contrast. Finally, wide described, including optical, infrared, microwave, etc. literature on surveyed throughout text.
springer.com
sci-hub.st 参考文章(171)
Roberto S. Aga, Jason Brookman, Jonathan Dizon, Judy Z. Wu, Development of a dual-channel scanning microwave/optical microprobe Applied Physics Letters. ,vol. 84, pp. 1979- 1981 ,(2004) , 10.1063/1.1669066
K Hasselbach, C Veauvy, D Mailly, MicroSQUID magnetometry and magnetic imaging Physica C-superconductivity and Its Applications. ,vol. 332, pp. 140- 147 ,(2000) , 10.1016/S0921-4534(99)00657-7
S.A. Gudoshnikov, B.Ya. Liubimov, L.V. Matveets, A.P. Mikhailenko, Yu.V. Deryuzhkina, Yu.S. Sitnov, O.V. Snigirev, Flux guide for high-Tc SQUID microscope with high spatial resolution Physica C-superconductivity and Its Applications. ,vol. 368, pp. 66- 69 ,(2002) , 10.1016/S0921-4534(01)01141-8
P. Scott Carney, Richard A. Frazin, Sergey I. Bozhevolnyi, Valentyn S. Volkov, Alexandra Boltasseva, John C. Schotland, Computational Lens for the Near Field Physical Review Letters. ,vol. 92, pp. 163903- ,(2004) , 10.1103/PHYSREVLETT.92.163903
Walid A. Atia, Christopher C. Davis, A phase-locked shear-force microscope for distance regulation in near-field optical microscopy Applied Physics Letters. ,vol. 70, pp. 405- 407 ,(1997) , 10.1063/1.118318
Chen Gao, Tao Wei, Fred Duewer, Yalin Lu, X-D Xiang, None, High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope Applied Physics Letters. ,vol. 71, pp. 1872- 1874 ,(1997) , 10.1063/1.120444
R. Hillenbrand, F. Keilmann, Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy Applied Physics Letters. ,vol. 80, pp. 25- 27 ,(2002) , 10.1063/1.1428767
T Masaki, A Ono, K Goto, Y Inouye, S Kawata, H Kuroda, None, Apertured cantilever probes for infrared near-field scanning optical microscopy Japanese Journal of Applied Physics. ,vol. 41, pp. 71- ,(2002) , 10.7567/JJAPS.41S1.71
Charles Paulson, A. B. Ellis, Leon McCaughan, Brian Hawkins, Jingxi Sun, T. F. Kuech, Demonstration of near-field scanning photoreflectance spectroscopy Applied Physics Letters. ,vol. 77, pp. 1943- 1945 ,(2000) , 10.1063/1.1312253
X.-D. Xiang, C. Gao, Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscope Materials Characterization. ,vol. 48, pp. 117- 125 ,(2002) , 10.1016/S1044-5803(02)00277-2