Monitoring multilayer film growth with the atomic force microscope. Aluminum(III) alkanebisphosphonate multilayer films and DNA immobilization

摘要: The growth of aluminum(III) alkanebisphosphonate multilayer thin films on gold surfaces in aqueous solutions was investigated by probing the surface charge following alternate treatments with anionic phosphonate and cationic Al(III). This accomplished determining force between a modified silica tip an atomic microscope (AFM) film-covered substrate. AFM measurements revealed that formation followed regular layer-by-layer mechanism as evidenced occurrence reversal each adsorption step. However, quantitative data, obtained theoretical fits data to complete nonlinear Poisson−Boltzmann equation knowledge probe potential, indicated became less ordered increase number layers. measuring technique also employed monitor immobilization both single-stranded (ss) double-strande...