Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation
作者： I.H.S. Hassan , K. Arabi , B. Kaminska
关键词: Pulse-density modulation 、 Integral nonlinearity 、 Comparator 、 Electronic engineering 、 Engineering 、 Modulation 、 Integrator 、 Differential nonlinearity 、 Delta-sigma modulation 、 Analogue electronics
摘要: This paper presents a new built-in self test technique for digital to analog converters (DAC). The consists of inserting the DAC under in an oscillating loop forming sigma-delta modulator. distortions are then seen at output as PDM information. A simple up/down counter converts into word that is used signature. Functional specifications such offset, differential nonlinearity (DNL), integral (INL) and dynamic can be digitally measured using this technique. As feature modulation, circuits form modulator (integrator comparator) do not need high performance terms accuracy speed. characteristic allows have no limitations resting frequency resolution DACs. also applied ADC-DAC pair applications require both data same chip.
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