A novel approach to index site-specific grain boundary plane
作者： Wenjun Kuang , Xingyu Feng , Jiayu Xie
DOI: 10.1016/J.MATCHAR.2021.110999
关键词: Materials science 、 Crystal 、 Plane (geometry) 、 Coordinate system 、 Diffraction 、 Electron backscatter diffraction 、 Crystal twinning 、 Grain boundary 、 Geometry 、 Focused ion beam
摘要: Abstract A novel approach using focused ion beam (FIB) and electron backscatter diffraction (EBSD) or transmission Kikuchi (TKD) was developed to characterize all five parameters of the individual grain boundary. With this approach, orientations boundary trace angles on two perpendicular surfaces can be measured. Then plane normal in sample coordinate system determined transformed indices crystal systems. FIB-TKD is a viable alternative FIB-EBSD when EBSD measurement can't conducted surface which degraded by oxidation corrosion. This verified coherent twin alloy 690. The accuracy present method better than 3°. provides convenient efficient solution for measuring site-specific during FIB preparation.
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