High-Pressure Ion Source Combined with an In-Axis Ion Trap Mass Spectrometer. 1. Instrumentation and Applications

作者: J. C. Mathurin , T. Faye , A. Brunot , J. C. Tabet , G. Wells

DOI: 10.1021/AC000171M

关键词: ReflectronAnalytical chemistryChemistryQuadrupole ion trapIon trapIon sourceElectron ionizationIonIon beam depositionMass spectrometry

摘要: A new combination of a dual EI/CI ion source with quadrupole trap mass spectrometer has been realized in order to efficiently produce negative ions the reaction cell. Analysis volatile compounds was performed under chemical ionization (NICI) during period where selected reactant ions, previously produced external source, were allowed interact molecules, introduced by hyphenated techniques such as gas chromatography. The O2•-, CH3O-, and Cl- used this study ensure specific ion/molecule interactions proton transfer, nucleophilic displacement, or charge exchange processes, respectively leading even-electron species, i.e., deprotonated [M − H]- diagnostic R]- odd-electron M-• molecular species. orientation depends on thermochemistry reactions within kinetic controls. First analytical results are presented here for trace-level detection several contaminants und...

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