UPS and XPS reference data of O, N, NO, (NO2)2, NH3, H2O, OH, H2S, SH and S on Ge surfaces
作者： W. Ranke
DOI: 10.1016/0368-2048(93)80053-O
关键词: Reference data (financial markets) 、 X-ray photoelectron spectroscopy 、 Crystallography 、 Spectral line 、 Nuclear chemistry 、 Chemistry 、 Spectral data 、 Substrate (electronics)
摘要: Differently oriented Ge surfaces have been exposed to O 2 , NO, NO 2 , NH 3 , H 2 O and H 2 S. Upon different thermal treatments and depending on the substrate orientation, the …
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