Experimental comparison between speckle and grating-based imaging technique using synchrotron radiation X-rays.

作者: Yogesh Kashyap , Hongchang Wang , Kawal Sawhney

DOI: 10.1364/OE.24.018664

关键词: DetectorSpeckle patternOpticsSynchrotron radiationPhysicsSynchrotronPhase-contrast imagingPixelDifferential phaseGrating

摘要: X-ray phase contrast and dark-field imaging techniques provide important complementary information that is inaccessible to the conventional absorption imaging. Both grating-based (GBI) speckle-based (SBI) are able retrieve multi-modal images using synchrotron as well lab-based sources. However, no systematic comparison has been made between two so far. We present an experimental GBI SBI with radiation source. Apart from simple setup, we find does not suffer issue of unwrapping, which can often be problematic for GBI. In addition, also superior since orthogonal differential gradients simultaneously extracted by one dimensional scan. The less stringent requirements detector pixel size transverse coherence length when a second or third grating used. This study provides reference choosing most suitable technique diverse applications at facility.

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