Achieving I/sub DDQ/I/sub SSQ/ production testing with QuiC-
作者： K.M. Wallquist
关键词: CMOS 、 Production testing 、 Reliability engineering 、 Units of measurement 、 QUIC 、 Iddq testing 、 Velocity measurement 、 Embedded system 、 Engineering
摘要: IDDQ testing has become a powerful tool for improving the quality of CMOS integrated circuits. One drawback this is its speed--often compromising speed accuracy, or vice versa. Given that well-designed part will have very low quiescent current, accuracy cannot be sacrificed; given test time perhaps most expensive an IC's final cost, sacrificed. This article describes QuiC-Mon, loadboard mounted circuit which capable offering both and accuracy--over 1-MHz measurement rates at sub-mA accuracy.
computer.org
sci-hub.se 参考文章(6)
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