High field magnetic force microscopy
作者： Roger Proksch , Erik Runge , Paul K. Hansma , Sheryl Foss , Brian Walsh
DOI: 10.1063/1.360022
关键词: Electromagnet 、 Electropermanent magnet 、 Microscope 、 Magnetic force microscope 、 Magnetic field 、 Erasure 、 Analytical chemistry 、 Optics 、 Magnetization 、 Magnet 、 Materials science
摘要: Magnetic force microscope (MFM) studies of high‐density thin‐film recording media have been performed in the presence an applied magnetic field. In particular, erasure behavior bit transitions investigated. For these a compact, high‐field dc magnet has constructed that fits laser head Nanoscope III multimode microscope. Because space constraints and concern over thermal drifts which could affect stability MFM, rotating permanent was used instead electromagnet. The is mounted yoke guides varying amounts flux to sample. This observe bits hard disk. field also magnetized MFM cantilever, making it possible magnetically characterize both sample probe.
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