作者: Howard E. Katz , Andrew J. Lovinger , Joyce G. Laquindanum
DOI: 10.1021/CM970627P
关键词: Thiophene 、 Single crystal 、 Analytical chemistry 、 Electron diffraction 、 Electron mobility 、 Perpendicular 、 Thin film 、 Oligomer 、 Stereochemistry 、 Organic semiconductor 、 Chemistry
摘要: The thin film structure and hole mobility of 5,5‘‘‘-dihexylquaterthiophene are reported. Films sublimed onto Si/SiO2 or carbon grids held at 30−100 °C single-crystal-like over tens micrometers as shown by electron diffraction. orientation has the long axis quaterthiophene core nearly perpendicular to substrate. ranges from 0.05 0.23 cm2/Vs, depending on deposition temperature, much higher than would be expected based earlier thiophene oligomer data.