作者: Oleg Petruk , Roman Szewczyk , Tymoteusz Ciuk , Włodzimierz Strupiński , Jacek Salach
DOI: 10.1007/978-3-319-05353-0_60
关键词: Test sensitivity 、 Hall effect 、 Materials science 、 Input offset voltage 、 Graphene 、 Laboratory testing 、 Optoelectronics 、 Sensitivity (control systems) 、 Magnetic field 、 Electronic engineering
摘要: … Laboratory testing stand was developed to test sensitivity and offset voltage in hall effect structures under external magnetic field. Characteristics of investigated structures were …