作者: Laertis Economikos , Glenn L. Cellier , Timothy M. McCormack , Rajasekhar Venigalla
DOI:
关键词: Mechanical engineering 、 Abrasive 、 Chemical-mechanical planarization 、 Polishing 、 Structural engineering 、 Engineering
摘要: A chemical mechanical polishing (CMP) system includes a rotating table including platen providing at least two pressure zones having different pressures; sub-pad positioned on the platen, plurality of openings allowing for transmission pressures therethrough; fixed abrasive pad sub-pad; and pressure-creating sealingly coupled to creating in zones, wherein create topography pad. related method are also provided.