Applying different pressures through sub-pad to fixed abrasive cmp pad

作者: Laertis Economikos , Glenn L. Cellier , Timothy M. McCormack , Rajasekhar Venigalla

DOI:

关键词: Mechanical engineeringAbrasiveChemical-mechanical planarizationPolishingStructural engineeringEngineering

摘要: A chemical mechanical polishing (CMP) system includes a rotating table including platen providing at least two pressure zones having different pressures; sub-pad positioned on the platen, plurality of openings allowing for transmission pressures therethrough; fixed abrasive pad sub-pad; and pressure-creating sealingly coupled to creating in zones, wherein create topography pad. related method are also provided.

参考文章(5)
Michael F. Lofaro, Woody Ray Smith, Shyng-Tsong Chen, Stacked polish pad ,(2000)
Annette Margaret Crevasse, John Thomas Sowell, Alvaro Maury, Sanjay Patel, Apparatus for performing chemical-mechanical polishing ,(1997)
Yoshihiro Inao, Atsushi Miyanari, Yasumasa Iwata, Akihiko Nakamura, Method of thinning wafer and support plate ,(2007)
John White, Shijian Li, Manoocher Birang, Fred C. Redeker, Platen arrangement for a chemical-mechanical planarization apparatus ,(2000)
Carsten Mehring, Travis R. Taylor, Assembly and method for generating a hydrodynamic air bearing ,(2003)